Automated Testing Complex ATC

Purpose:
To ensure comprehensive ground-based electrical tests of the spacecraft and verify the operability of its individual systems at the manufacturer of the product and in the operating organization, including for start-up inspections.
Year of release: 2007
Guaranteed service life (years): 10
Estimated production / delivery time (months): 12
Possibility to adapt the product to customer requirements: Да


Parameter Value
Galvanic isolation of the test product from the complex Opto-relay or mechanical relay
Universal Communication Interfaces Ethernet, RS 232/422/485
The issuance of discrete contact and contactless signals. Number of signals 672
Issuing matrix commands 32 х 32
Reception of discrete impulse and on-off signals 1440
DC voltage measurement. Number of channels 48 channels
Entering and processing telemetric information Yes
DC voltage measurement. Number of channels up to 5 power sources
Measurement of resistance and control of insulation resistance of the cable network of the tested product. Number of channels up to 510 channels
Remote control and product monitoring at a distance up to 250 m
Uninterruptible power supplies for the correct completion of the test program in the event of a power failure IBP
Real-time multi-tasking software QNX, Windows, Microsoft Office, special software for preparing and executing test programs, test software
The switching unit (cross), designed to interface the terrestrial cable network with the complex 450 x 450 pins per block
Spare parts all replaceable devices

Description

ATC has a redundant network structure and is based on industrial computers KI-P1.7, constructs Knurr, Shroff, domestic devices. The main ATC devices are made in the form of a personal computer and communication devices with the object. Galvanic isolation of th
... ATC has a redundant network structure and is based on industrial computers KI-P1.7, constructs Knurr, Shroff, domestic devices. The main ATC devices are made in the form of a personal computer and communication devices with the object. Galvanic isolation of the complex from the test product. Spare parts for all replaceable devices.
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